Date:	November 7 , 2007
Schedule:	Registration/Networking 5:00 pm - 6:30pm Dinner Buffet 6:30 pm - 7:15 pm Technical Presentation 7:15 pm - 8:00 pm
Location:	Holiday Inn Ronkonkoma 3845 Veterans Highway Ronkonkoma, NY 11779 Ph: 631-585-9500
Cost:	Members: $35.00 After November 5,2007 Non-Members: $40.00 After November 5, 2007 Student Members: $20.00 after November 5, 2007
Exhibits:	There are a limited number of vendor tables available for this meeting at a cost of $200.00 or 2 for 300.00. Please contact Steve Lehnert (slehnert@mdipower.com) or Scott Baldassarre (sbaldassarre@miteq.com) if you are interested.
Registration:	Email: sbaldassarre@miteq.com Phone: Scott Baldassarre: (631) 436-7400 X 9853 WEB: www.imaps.org/chapters/metro

Evaluation of Wire Bond Systems for Manufacturability

Presented by Student Members from Farmingdale College of the State University of NY:

Tim Resig & Christian Grigoleit
Facilitated by: Mike McKeown Orthodyne

Abstract:

As automotive electronics evolve, interconnects between logic processor units and the remote sensors or actuator components play a critical role in assuring reliability and low manufacturing cost of major control systems. These interconnects are typically aluminum wires attached by ultrasonic wire bonding. Several types of substrates are used to mount the logic microprocessors, and facilitate the wire bonding attachment operation.

This paper evaluates two different substrates/coatings for optimal wire bonding characteristics. The substrates/ coatings are aluminum inlay and electroplated nickel phosphorous. Wire bond evaluations included pull testing, shear testing and bond remnants characterization for each of the substrates. Additionally, wire diameter was varied to identify process manufacturing parameters that consistently and repeatedly produced functional wire bonds.

PowerRibbon™ Bonding - An Alternative Interconnect Process for Present & Future Electronics Applications

Presented by Mike McKeown Orthodyne & Tim Resig

Large wire bonding is used in automotive electronics packaging since the mid-1970s. It is used as the interconnect of choice between the module housing as well as the power device and the electronic substrate. Large wire bonding is also the most commonly used interconnect for industrial power modules. It’s flexibility paired with benefits of being an environmentally friendly and robust process performed at room temperature made it the perfect interconnect choice for these complex applications with high reliability requirements. Electronic power steering and hybrid drives are only two of many examples in modern automotive applications which need increasingly higher current capabilities, requiring high power module packaging technology. To address these applications, manufacturers have historically increased the number of large aluminum wires per device or moved to alternative technologies. This posted a growing challenge for large wire bonding. Even though well established and accepted, in both areas, industrial and automotive power modules, the ever larger numbers of wires to be bonded virtually defect-free in a high volume environment under significant cost common for automotive applications, required a fresh review of the interconnect process and the equipment used. Where multiple wires only impact productivity, alternate technologies are less flexible or less reliable than wire bonding and can require extensive re-qualification efforts and investments in new capital equipment. Orthodyne's new PowerRibbon™ Technology was developed to meet the current and future interconnect needs of the power module market. PowerRibbon™ is a new technology designed to work in existing aluminum wire bonding applications, as well as new designs specified for PowerRibbonTM bonding. It requires little change in many of today's existing designs and utilizes the same environmentally friendly room temperature ultrasonic process as aluminum wire bonding. PowerRibbon™ combines the flexibility and robustness of the large aluminum wire bonding process with a higher productivity and in many applications an improved product performance. This paper will discuss wire and ribbon bonding design and performance aspects in present and future automotive applications.

IMAPS-Benelux Autumn Event This Thursday, November 8, 2007, on Latest trends in Electronic Assembly    ^ Top
The IMAPS Benelux Chapter will hold its Autumn 2007 event on Thursday, November 8, 2007, at TBP Electronics bv, Vlakbodem 10, 3247 CP Dirksland, The Netherlands.

PDF of Program/Registration Form

PROGRAM:

9.00        Registration, coffee, exhibition

9.30        Welcome by the chairman
Nienke Bruinsma, Philips Applied Technologies, NL

9.35        Roadmap assembly technology – trends and challenges
Boris Leekens, TBP Electronics nv, BE
TBP electronics will react to its new era of assembly in which logistics, quality, traceability, technology and flexibility are leading. Therefore the choices in manpower, equipment and software are of essential importance. The challenge is to reach the highest level in automation.

10.00      Packaging technology trends for future circuits – Opportunities of new interconnect types
Bernd Römer, Infineon Technologies AG, DE
System integration is becoming more and more mainstream for a wide range of applications, from consumer to high performance applications. Semiconductor components for system integration originate from different front end technologies (e.g. silicon ICs, passive chip, power, MEMS, etc.). The use of advanced packaging is an efficient and cost effective way for heterogeneous system integration. Packaging technologies offer many opportunities to integrate different chips, passive components, including separately optimized systems to a system-in-package. 3D integration techniques applying various types of stacked structures and wafer level assembly offer an excellent way to address high electrical performance, e.g. less delay time at higher miniaturization. An overview on different approaches will be given with focus on the future opportunities and collaboration needs to enable such designs.

10.50      Coffee, exhibition

11.20      Through wafer interconnect technologies for 3D system-in-package
Eric van Grunsven, Philips Applied Technologies, NL
Philips and NXP have developed a SB-SiP platform (silicon based system in package) to enable heterogeneous integration. Next generations of modules in the platform, especially in the application of cellular RF transceivers, require a three dimensional interconnect. This paper presents technologies that recently have been studied. First, an overview of different through wafer interconnect technologies, developed within Philips and NXP, will be given. Next, the considerations for through wafer interconnect will be discussed, with special attention on via forming by means of deep reactive ion etching. Third, the first results of a recently developed concept for via filling, by means of paste printing, will be presented.
 
11.45      Fine pitch components and lead free assembly: trends and production issues
Bart Allaert, Connectronics, division of IPTE nv, BE
The introduction of lead-free manufacturing has led to several production issues.  At the same time, the diversity of packages is growing, and the evolution towards finer pitch components is continuing.  The combination of these trends asks for specific assembly processes and a better manufacturing control.  In this presentation the trends regarding fine pitch components and new packages will be given and typical problems with lead free assembly of fine pitch components will be discussed.

12.10      Lunch, exhibition, followed by factory tour

13.30      Die and  Flip Chip Bonding Equipment for advanced Technologies
Christian Ossmann, Datacon Technology GmbH, AT
Requirements of present packages are mainly driven by two factors. These are on one side the packaging cost and on the other side the increased functionality at highest possible fill factor.
This presentation will show some trends as they are seen by a leading equipment supplier. Solutions to handle thin dice as well as different solutions for stacked die packages will be presented. These techniques are already state of the art for the production of memory devices.

To follow the trend towards higher integration, direct contact bonding of stacked dice will be the next stage. Especially the up coming through hole via (TSV) and the flip chip type solid face to face technology require dedicated equipment with a high alignment accuracy at a significant speed. The state of the art equipment for the production will be discussed, as well as the impact of these technologies on future generations of equipment.

14.20      Het omschakelen naar RoHS (loodvrije) productie in het midden - en klein bedrijf.
Gerrit Versteeg, Global Electronics, NL
Toegespitst op assemblage voor derden. Wat komt er op ons af? Waar liggen onze verantwoordelijkheden? Welke informatie is er beschikbaar en waar? Waar en waarom is er externe kennis benodigd? Al deze vragen hebben op logistieke - evenals productiezaken betrekking.

Waar zijn we gestart in 2004 en waar staan wij op dit moment? Welke nieuwe ontwikkelingen komen er nog op ons af? Deze omschakeling is een keten verantwoordelijkheid en de Keten bepaalt het uiteindelijke succes.

14.45      Inspection and Metrology for HDI substrates
Pieter Vandewalle, ICOS Vision Systems, BE
The CI-T120S/CI-T130S is an automated metrology and inspection tool dedicated to High Density Interconnect substrates. The machine combines very advanced inspection technology with very fast substrate handling and sorting capabilities. The innovative 4-in-1 inspection concept combines surface and warpage inspection with the latest COSSAP confocal metrology: bump metrology with metrological accuracy of less than 1 micron, substrate warpage and pad inspection, top surface inspection and bottom surface inspection. 

The high throughput of the machine enables substrate manufacturers to perform 100% inspection and metrology in a production environment.

15.10      Tea, exhibition

15.30      Combination of experiments and simulations in board level reliability
Hans de Vries, Philips Applied Technologies, NL
Several trends in modern electronic applications require a different approach to reliability assessment. Among other things the combination of experiments and model simulations are necessary to save time and costs in reliability tests. In particular the ongoing trend in portable applications requires new types of packages such as HV-QFN, and testing methods, such as board level drop tests and cyclic bending. In this contribution examples will be given of experiments and simulations mutually supporting each other.

15.55      PBA DfX in the RoHS era: Specify the requirements!
Geert Willems, IMEC, BE
From experience we know that a typical PBA design is incomplete with regard to the specification of PCB substrate, components and assembly variables when the design leaves the design department and enters the electronic supply chain. The missing parameters are filled in by the different players in the supply chain such as purchasing departments, PCB manufacturing, component suppliers, assembly contractors, etc. The robust SnPb soldering with its relatively large process window and benign process temperatures was relatively forgiving for this rather nonchalant way of working. However, those days are over since we have entered the RoHS era. The increased material, processing and logistical complexity, the reduced process windows and increased temperatures combined with new and reinforced failure mechanisms both increases the chance on as well as the gravity of PBA failure. Something even Microsoft has experienced recently. In this presentation we discuss what needs to be specified and what may happen if you don't.

16.20      Informal meeting, drinks will be served

17.15      Closing

REGISTRATION:

Register as (includes lunch and coffee) :

Non-Benelux IMAPS member                               80 EUR
membership nr #  ……………………. 

Only for IMAPS Benelux members :                      140 EUR
workshop fee includes 2008 membership fee
membership nr #................................ 

Non member                                                         150 EUR
workshop fee includes 2008 membership fee

Student fee                                                             30 EUR

Cancellations after November 5 will not be refunded.
After registration, you will receive a confirmation and driving directions.

To register or inquire about tables for exhibition, please contact:

Katrien Vanneste, ELIS-TFCG, Gent University                 
Technologiepark 914A, B-9052 Zwijnaarde 
Tel: +32 (0) 9 264 5350
FAX: +32 (0) 9 264 5374                                                             
E-mail : katrien.vanneste@ugent.be

IMAPS Europe and the Global Business Council To Deliver Two Events During Productronica 2007    ^ Top
Two events sponsored and co-sponsored by IMAPS Europe will be held
during Productronica next week in Munich on Wednesday, November 14:

a) iNEMI European Roadmap Kickoff Workshop
http://www.inemi.org/cms/calendar/2009_RM_European_Kickoff_Nov_07.html; and
b) GBC Workshop http://www.imaps.org/gbc/gbc07germany.htm.

Both workshops are free of charge. See you in Munich!

New England Chapter 2008 Symposium and Expo Theme Contest    ^ Top
The New England Chapter 007 theme for the 34th symposium and expo was a great and fun success. You know we like to dress up and have a little fun. This year we are opening up the theme suggestion to our members for our 35th Symposium and Expo which will be held May 6th 2008 at the Holiday Inn Boxborough Woods, Boxborough, MA. Submission Deadline is November 26th. For more information, visit www.imapsne.org.

Past themes include: ‘007 Technology Shaken Not Stirred’; Texas Hold Em’; Hawaiian; and Cinco De Mayo.

• Announcement and prizes will be given at the December 4th Technical Chapter Meeting
• One (1) First Prize – 4 GB iPod Nano – 1000 song, video, photo capability (award winner does not need to be present at the Chapter meeting – but is strongly encouraged)
• Ten (10) 2 GB – flash drives – issued to the first 10 contest submissions (award winner does not need to be present at the Chapter meeting – but is strongly encouraged)
• You must be a current IMAPS Member
• Entries will be judged on originality and feasibility of execution.  
• Judging will be by a secret IMAPS New England Panel.  
• Submission Deadline is November 26th
• Members of Executive Committee are excluded from participation.

For more details and to submit your theme suggestions, visit http://www.imapsne.org/docs/08_symp_exp_theme_contest.doc. You can also send e-mail to: Contest@imapsne.org or fax to 508-222-0220 attention Mark Occhionero.

New England Chapter Dinner Meeting with Presentation on Nanomaterials: Revolutions Never Go As Planned   ^ Top

Date:	Tuesday, December 4, 2007
Schedule:	5:30 p.m. Registration, Socializing, Networking & Cash Bar 6:30 p.m. Dinner 7:30 p.m. Presentation by F. Mark Modzelewski - VP Strategic Opportunities at NanoDynamics
Location:	Westford Regency Inn & Conference Center 219 Littleton Road Westford, MA 01886 978.692.8200 Directions: I-495 to Exit 32 for Boston Road toward Westford 0.2 mi. Keep right at fork, follow signs for Rt-225/Littleton/Rt-110/Groton and merge onto Boston Rd. 0.1 mi. Turn right at Littleton Rd/Rte. 110 - 0.4 mi.
Cost:	Meeting Only: No Charge Meeting with Dinner: Members: $25.00 Non-Members: $30.00 Retired Members: $20.00 Student Members: $5.00

"Nanomaterials: Revolutions Never Go As Planned"

Abstract:

In 2001 over 500 nanotech start-ups launched across the world. Venture dollars were pouring into the field. The federal government made an unprecedented investment in the field to ensure US leadership.

Nothing was to be left untouched by nanotech's power: materials, manufacturing, semiconductors, medical treatments, energy, even life itself.  Time, Newsweek, Wall Street Journal, CBS, the Washington Post and other media outlets had headlines screaming that the world was about to change overnight.  The financial markets were supposed exposed to explode with the new Microsoft’s, Netscape’s and Genzyme’s. Then......silence.

Today, venture capital has all but abandoned the nano space.  No companies have successfully IPOed. There are real questions as to whether the federal government will continue the National Nanotechnology Initiative.  What happened to nanotech?  Is the field going to remain so small that no one cares? Or is it hiding below the surface about to deliver on its promise and more?

F. Mark Modzelewski is the Vice President of Strategic Opportunities at NanoDynamics Materials Company, where he develops new partnerships, collaboration, licensing and investment opportunities. He previously co-founded the Benet Group, Leonardo BioSystems, Lux Research, and the NanoBusiness Alliance. He has served as a senior executive at Opion, GolinHarris and NRW. In addition, he has consulted for companies ranging from NanoSys to Engelhard to MasterCard to Yahoo to eSpeed to Pixar to DaimlerChrysler.

Mark is a member of the Nanotechnology Technical Advisory Group to the President’s Council of Advisors on Science and Technology (PCAST). He is among the most well known figures in technology and was recognized by Forbes as a "powerbroker" and has been featured  in Time, Newsweek, US News, ABC, BBC, NY Times, Business Week, Fortune, Wall Street Journal, among  others.  Mark also appeared regularly as CNBC technology commentator and on occasion as a co-host of SquawkBox.

Before entering the private sector, Mark was an appointee in the Clinton Administration developing policy, legal and communication strategy efforts on issues ranging from Y2k preparedness, US mortgage and banking systems, the online transformation and integration of HUD and FHA programs, digital divide efforts, biotech and organic food standards, and regional economic development programs. He is a graduate of the University of Denver College of Law and Boston University.

Reservations must be received by Wednesday, November 28th

Send Registrations to: Susan Munyon
96 Grant Way, Lancaster, MA 01523-3112
e-mail SusanMunyon@comcast.net
978-466-1877 phone/fax

Bring checks payable to “IMAPS New England”

At-door registration is an additional $5.00. If you make a reservation and can’t make the meeting, please cancel by Monday, December 3rd or the Chapter is billed for your meal.

There's no charge for the Technical Meeting, only for dinner. You may attend without eating dinner. Dinner Choices: 1) Breast of Chicken, Apple and Brie with Boursin Sauce, 2) Baked Stuffed Fillet of Grey Sole with Lobster Sauce

For more information, visit www.imapsne.org/meeting.html.

Florida Chapter Dinner Meeting with Presentation on Origami Packaging - Novel Printed Antenna Technology for Ad-hoc Sensor Applications   ^ Top

Date:	December 6, 2007
Schedule:	6-7 pm Social 7pm Dinner w/presentation following
Location:	Holiday Inn Select, Orlando Airport 5750 T.G. Lee Blvd Orlando, FL 407-851-6400
Cost:	$25, dinner includes entrée, salad, coffee/tea, and dessert
Exhibits:	We are offering tabletop space for suppliers with power for $150 each while spaces last. Set up is at 5pm with the event over by 9pm.
Contact:	Tim Davis 407.341.3359 tim@jdm-associates.com

Origami Packaging – Novel Printed Antenna Technology for Ad-hoc Sensor Applications

Presented By Sergio Melais, University of South Florida

Abstract:

The work presented in this paper introduces a 3-D antenna designed and fabricated on a flexible paper thin substrate for operation at 915MHz with a frequency bandwidth ranging from 902-928 MHz. The major innovative feature introduced in this work is the use of a deposition process for printing radiating elements over a 3-D structure. For this design, the antenna selected is a printed dipole due to its simplicity and radiation characteristics (omni-directional pattern). The 3-D substrate over which this dipole is printed is the tetrahedron (pyramid with a triangle as base), a geometrical polyhedron offering symmetry and an excellent candidacy to illustrate the new paper thin antenna structural integration.

The layout of the antenna consists of a dipole printed on two sides of the tetrahedron connected to a balanced-to-unbalanced line transition on a third side. The base of the tetrahedron serves as a ground plane for the microstrip feed (coax feed). Furthermore, an L-C-L matching network is integrated to enhance the impedance match coming from the parallel plate section to the microstrip section of the line.

The tetrahedron antenna is first designed and simulated (HFSS10) on a flat configuration. Next, its dimensions are optimized and folded into a tetrahedron. The simulation results have demonstrated that a good radiator has been achieved, conserving adequate dipole characteristics. Finally, a prototype of this tetrahedron is fabricated on paper, LCP, and etched copper LCP substrates. The results support a satisfactory operation for the design.

Third European ATW on Micropackaging and Thermal Management, January 29-31, 2008 La Rochelle, France    ^ Top
The Third European ATW on Micropackaging and Thermal Management will be held, January 29-31, 2008 in La Rochelle on the French Atlantic coast.

The aim of the workshop - now a yearly must - is to help the exchange of information between scientists and engineers who are involved in thermal management, in R&D labs or in the industry.

Like it was done for the second issue, the ATW will be open to table top exhibits, strictly limited to organisations involved in the field of thermal management.

As usual, the workshop is organized, at hotel “Mercure Oceanide”, on a global fees basis for registration, hotel and meals.

Visit www.imapsfrance.org for more information.

Interested to attend?

Please contact Florence Vireton at the IMAPS France office, imaps.france@imapsfrance.org
Phone: 33-(0)1-39 67 17 73    Fax: 33-(0)1-39 02 71 93